accelerated-ageing-testing-on-combined-lpits

Accelerated Ageing Testing on Combined LPITs

The current trend towards automated monitoring systems requires substations to become more and more digitalized. However, conventional instrument transformers provide analogue reference values for measurement of current and voltage by either inductive current and voltage transformation, or capacitive transformation in the latter case.  In order to prove the longevity and robustness of digital instruments, EDF R&D and CONDIS initiated a partnership to conduct accelerated ageing tests on a HV combined low-power instrument transformer (cLPIT) under extreme climatic and pollution exposure.

Conference animated by :

Peter Grimm

Peter Grimm

Business Development,

CONDIS SA

Tuesday, January 19th

from 4:00PM to 4:45PM

(CET)

17 subscribers | 45 mins

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Replay until September 18, 2021

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 Add to calendar 01/19/2021 16:00:00 01/19/2021 16:45:00 Europe/Paris Accelerated Ageing Testing on Combined LPITs The current trend towards automated monitoring systems requires substations to become more and more digitalized. However, conventional instrument transformers provide analogue reference values for measurement of current and voltage by either inductive current and voltage transformation, or capacitive transformation in the latter case.  In order to prove the longevity and robustness of digital instruments, EDF R&D and CONDIS initiated a partnership to conduct accelerated ageing tests on a HV combined low-power instrument transformer (cLPIT) under extreme climatic and pollution exposure. no-reply@webikeo.fr webikeo.com/webinar/accelerated-ageing-testing-on-combined-lpits MM/DD/YYYY